The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2020
Filed:
May. 09, 2018
Gopro, Inc., San Mateo, CA (US);
Adrien Fontvielle, San Mateo, CA (US);
Antoine Meler, Chapareillan, FR;
Benoit Fouet, Montbonnot, FR;
Claire Mathis, Chambery, FR;
Denys Bulant, San Mateo, CA (US);
Emeric Grange, San Mateo, CA (US);
Hervé Bonaillie, San Mateo, CA (US);
Jerome Lehaire, San Mateo, CA (US);
Julien Morat, Lancey, FR;
Martin Arnoux, San Mateo, CA (US);
Mickaël Heudre, San Mateo, CA (US);
Renan Coudray, Montmelian, FR;
Stéphane Gamet, San Mateo, CA (US);
Thomas Vuillermet, Curienne, FR;
GoPro, Inc., San Mateo, CA (US);
Abstract
Images of a scene may be captured by a set of image capture devices. Overlapping areas of the images may be identified based on the topology of the set of image capture devices. Frontiers within the overlapping areas of the images may be identified based on borders of the images. Sample points for the images may be distributed along the frontiers. Warp parameters including an anti-symmetric warping portion and a symmetric warping portion may be determined at the sample points. Displacement values may be determined at the sample points based on the warp parameters. Warp maps for the images may be determined based on diffusion of the displacement values. Displacement maps for the images may be determined based on interpolation of the warp maps. The images may be modified based on the displacement maps.