The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2020
Filed:
Jul. 14, 2015
International Business Machines Corporation, Armonk, NY (US);
Hendrik F. Hamann, Yorktown Heights, NY (US);
Youngdeok Hwang, White Plains, NY (US);
Levente Klein, Tuckahoe, NY (US);
Jonathan Lenchner, North Salem, NY (US);
Siyuan Lu, Yorktown Heights, NY (US);
Fernando J. Marianno, New York, NY (US);
Gerald J. Tesauro, Croton-on-Hudson, NY (US);
Theodore G. van Kessel, Millbrook, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A parameter-based multi-model blending method and system are described. The method includes selecting a parameter of interest among parameters estimated by each of a set of individual models, running the set of individual models with a range of inputs to obtain a range of estimates of the parameters from each of the set of individual models, and identifying, for each of the set of individual models, critical parameters among the parameters estimated, the critical parameters exhibiting a specified correlation with an error in estimation of the parameter of interest. For each subspace of combinations of the critical parameters, obtaining a parameter-based blended model is based on blending the set of individual models in accordance with the subspace of the critical parameters, the subspace defining a sub-range for each of the critical parameters.