The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Dec. 15, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Oki Gunawan, Yorktown Heights, NY (US);

Lior Horesh, Yorktown Heights, NY (US);

Giacomo Nannicini, Yorktown Heights, NY (US);

Wang Zhou, Yorktown Heights, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/27 (2006.01); G06F 16/33 (2019.01);
U.S. Cl.
CPC ...
G06F 17/274 (2013.01); G06F 16/3344 (2019.01); G06F 17/271 (2013.01);
Abstract

A dimensionality analysis method, system, and computer program product, include defining a grammar that describes an admissible relationship between quantities in a data set, discovering symbolic expressions that intrinsically account for a dimensionality analysis based on the grammar, conducting a search that determines which valid expression in the data set satisfy the grammar, and selecting the expression that fits the dataset and minimizes a measure of a complexity of the expression.


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