The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Oct. 30, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Adrian P. Kyte, Broadstone, GB;

John D. Taylor, Eastleigh, GB;

Joseph R. Winchester, Hursley, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 16/31 (2019.01); G06F 16/13 (2019.01); G06F 16/33 (2019.01);
U.S. Cl.
CPC ...
G06F 16/31 (2019.01); G06F 16/13 (2019.01); G06F 16/3344 (2019.01);
Abstract

Method and system are provided for identifying parameter values in log entries from an application. The method includes receiving a log entry including language text and parameter values and referencing a localization language resource of the application that includes entry types in which translatable language text is distinguished from parameters for the purposes of language substitution for localization of the application. The method identifies an entry type in the localization language resource that corresponds to the log entry and analyzes the log entry with reference to the entry type to distinguish the parameter values from the translatable language text. The parameter values are then extracted from the log entry for analysis.


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