The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Jul. 24, 2015
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Jamini Samantaray, San Ramon, CA (US);

Pramode Kumar Sutrave, Phoenix, AZ (US);

Jigar Bhadriklal Patel, Peoria, AZ (US);

Thomas Bowyer, Mesa, AZ (US);

Muthukumar Ramalingam, Phoenix, AZ (US);

Assignee:

APPLIED MATERIALS, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/24 (2019.01); G06F 16/2453 (2019.01); G06F 16/28 (2019.01); G06F 16/2455 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24542 (2019.01); G06F 16/2455 (2019.01); G06F 16/285 (2019.01);
Abstract

Embodiments presented herein provide techniques for managing data in manufacturing systems. One embodiment includes receiving a set of data from a plurality of devices operating in a manufacturing environment. A portion of the set of data is written by a data management application to both a relational database and a distributed storage cluster that includes a plurality of storage nodes in a distributed computing environment. Upon receiving a query to extract a subset of data from the set of data, the query is analyzed to determine attributes of the query. Based, in part on the analysis, one of the relational database and the distributed storage cluster is selected for processing the query.


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