The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2020
Filed:
Apr. 25, 2018
Futurewei Technologies, Inc., Plano, TX (US);
University of Chicago, Chicago, IL (US);
Jeffrey Lukman, Chicago, IL (US);
Huan Ke, Chicago, IL (US);
Haryadi Gunawi, Chicago, IL (US);
Feng Ye, Mississauga, CA;
Chen Tian, Union City, CA (US);
Shen Chi Chen, San Jose, CA (US);
Other;
Abstract
Described herein are systems and methods for distributed concurrency (DC) bug detection. The method includes identifying a plurality of nodes in a distributed computing cluster; identifying a plurality of messages to be transmitted during execution of an application by the distributed computing cluster; determining a set of orderings of the plurality of messages for DC bug detection, the set of orderings determined based upon the plurality of nodes and the plurality of messages; removing a subset of the orderings from the set of orderings based upon one or more of a state symmetry algorithm, a disjoint-update independence algorithm, or a zero-crash-impact reordering algorithm; and performing DC bug detection testing using the set of orderings after the subset of the orderings is removed from the set of orderings.