The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2020
Filed:
Aug. 03, 2017
Futurewei Technologies, Inc., Plano, TX (US);
The University of Chicago, Chicago, IL (US);
Shan Lu, Chicago, IL (US);
Haopeng Liu, Chicago, IL (US);
Guangpu Li, Chicago, IL (US);
Haryadi Gunawi, Chicago, IL (US);
Chen Tian, Union City, CA (US);
Feng Ye, Mississauga, CA;
The University of Chicago, Chicago, IL (US);
Futurewei Technologies, Inc., Plano, TX (US);
Abstract
A method for detecting distributed concurrency errors in a distributed cloud computing system includes tracing operations that access objects in functions involving inter-process messaging, applying a set of happens-before rules to the traced operations. Analyzing the traced operations to identify concurrent operations that access a common object to generate a list of potential distributed concurrency errors (DCbugs). Pruning the list of DCbugs to remove DCbugs having only local effect and that do not generate run-time errors.