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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10599540 B1

PDFFull Text
Date of Patent:
Mar. 24, 2020

Filed:

Dec. 01, 2017

Memory test system and an operating method thereof

Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventors:

In Ho Choi, Gyeonggi-do, KR;

Ho Ryong Yoo, Gyeonggi-do, KR;

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:

IP & T Group LLP

Primary Examiner:

Phung M Chung

Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 3/06 (2006.01); G11C 29/52 (2006.01); G11C 29/56 (2006.01); G11C 29/46 (2006.01); G11C 29/44 (2006.01); G11C 29/10 (2006.01); G11C 29/42 (2006.01); G06F 11/34 (2006.01); G11C 29/12 (2006.01); G11C 29/04 (2006.01); G11C 29/36 (2006.01); G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3034 (2013.01); G06F 3/0653 (2013.01); G11C 29/10 (2013.01); G11C 29/42 (2013.01); G11C 29/44 (2013.01); G11C 29/46 (2013.01); G11C 29/52 (2013.01); G11C 29/56004 (2013.01); G06F 11/3485 (2013.01); G11C 29/76 (2013.01); G11C 2029/0409 (2013.01); G11C 2029/1208 (2013.01); G11C 2029/3602 (2013.01); G11C 2029/5606 (2013.01);
Abstract

A memory test system may include: a data storage device including a nonvolatile memory device, and a controller configured to control an operation of the nonvolatile memory device; and a test device configured to: request a test to the data storage device; request, to the data storage device, an output of a variable to be generated through driving of a firmware for performing the test, while the test is performed in the data storage device; and determine whether the firmware is normally driven based on the variable outputted from the data storage device.

Find Patent Forward Citations

Choi, In. (2020). Memory test system and an operating method thereof (U.S. Patent No. 10599540). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10599540

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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