The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2020
Filed:
Mar. 21, 2017
Japan Display Inc., Tokyo, JP;
Takuya Ito, Tokyo, JP;
Koji Shimizu, Tokyo, JP;
Japan Display Inc., Tokyo, JP;
Abstract
According to an aspect, a semiconductor apparatus includes semiconductor devices. Each semiconductor device includes: a state monitor that monitors a plurality of functions implemented by the semiconductor device, and outputs state monitoring signals; and an anomaly determination circuit that performs anomaly determination based on the state monitoring signals. When the anomaly determination circuit of a first semiconductor device detects that one or more of the functions of the semiconductor devices are abnormal based on a first anomaly determination result and a second anomaly determination result, the anomaly determination circuit of the first semiconductor device outputs an anomaly detection signal to the semiconductor devices. The first anomaly determination result is a result of the anomaly determination performed on the functions of the first semiconductor device, and the second anomaly determination result is a result of the anomaly determination performed on the functions of a second semiconductor device.