The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2020
Filed:
Mar. 15, 2016
Nec Corporation, Tokyo, JP;
Shinichiro Yoshida, Tokyo, JP;
Kentarou Yabuki, Tokyo, JP;
Kiyoshi Kato, Tokyo, JP;
Hideo Hasegawa, Tokyo, JP;
Hiroyuki Miyazaki, Tokyo, JP;
NEC CORPORATION, Minato-ku, Tokyo, JP;
Abstract
Accuracy of risks defined for abnormalities that might occur in a system is improved. The risk determination deviceincludes a classification unitand a determination unit. The classification unitclassifies abnormal patterns, each representing a relationship among metrics at a time of abnormality detection in a system, into groupsbased on a similarity between the abnormal patterns. The determination unitdetermines, based on the number of abnormal patternsclassified into each of the groups, likelihood of an abnormality of the corresponding group