The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2020
Filed:
Jul. 13, 2016
Massachusetts Institute of Technology, Cambridge, MA (US);
Andrew M. Siegel, Cambridge, MA (US);
Nandini Rajan, Cambridge, MA (US);
Angela M. Belcher, Cambridge, MA (US);
Neelkanth M. Bardhan, Cambridge, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
System and method configured to operate under conditions when the object being imaged destroys or negates the information which otherwise allows the user to take advantage of optical parallax, configured to elicit luminescence from the same targets in the object as a result of irradiation of these targets with pump light at different, respectively corresponding wavelengths, and acquire optical data from so-illuminated targets through the very same optical path to image the object at different wavelengths. One embodiment enables acquisition, by the same optical detector and from the same object, of imaging data that includes a reflectance image and multiple fluorescence-based images caused by light at different wavelengths, to assess difference in depths of locations of targets within the object.