The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Apr. 08, 2019
Applicant:

Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;

Inventor:

Zilin Deng, Shanghai, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/202 (2006.01); G01T 1/29 (2006.01); A61B 6/03 (2006.01); G01T 1/20 (2006.01); G01T 7/00 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2985 (2013.01); A61B 6/037 (2013.01); G01T 1/202 (2013.01); G01T 1/2018 (2013.01); G01T 7/00 (2013.01);
Abstract

A method for assessing the time of flight (TOF) performance of a positron emission tomography (PET) scanner is provided. The method may include obtaining raw data relating to radiation originating from an object from a PET scan by a PET scanner, the raw data including TOF information. The method may also include generating, based on a back projection algorithm, a first back projection image by reconstructing the raw data including the TOF information. The method may further include generating, based on the back projection algorithm, a second back projection image by reconstructing the raw data excluding the TOF information. The method may further include comparing the first back projection image with the second back projection image. The method may also include assessing, based on the comparison, the TOF performance of the PET scanner.


Find Patent Forward Citations

Deng, Zilin. (2020). Systems and methods for assessing time of flight performance of positron emission tomography scanner (U.S. Patent No. 10598803). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10598803

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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