The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Mar. 01, 2017
Applicant:

University of Washington, Seattle, WA (US);

Inventors:

Oleg A. Sapozhnikov, Seattle, WA (US);

Wayne Kreider, Seattle, WA (US);

Adam D. Maxwell, Seattle, WA (US);

Vera Khokhlova, Seattle, WA (US);

Assignee:

University of Washington, Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03H 3/00 (2006.01); G01S 7/52 (2006.01); G01S 15/89 (2006.01); A61B 8/00 (2006.01); A61N 7/00 (2006.01); A61N 7/02 (2006.01);
U.S. Cl.
CPC ...
G01S 7/5205 (2013.01); A61B 8/58 (2013.01); G01S 15/899 (2013.01); G01S 15/8918 (2013.01); A61N 7/02 (2013.01); A61N 2007/0078 (2013.01);
Abstract

The present technology relates generally to receiving arrays to measure a characteristic of an acoustic beam and associated systems and methods. The receiving arrays can include elongated elements having at least one dimension, such as a length, that is larger than a width of an emitted acoustic beam and another dimension, such as a width, that is smaller than half of a characteristic wavelength of an ultrasound wave. The elongated elements can be configured to capture waveform measurements of the beam based on a characteristic of the emitted acoustic beam as the acoustic beam crosses a plane of the array, such as a transverse plane. The methods include measuring at least one characteristic of an ultrasound source using an array-based acoustic holography system and defining a measured hologram at the array surface based, at least in part, on the waveform measurements. The measured hologram can be processed to reconstruct a characteristic of the ultrasound source. The ultrasound source can be calibrated and/or re-calibrated based on the characteristic.


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