The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Oct. 30, 2018
Applicant:

Yokowo Co., Ltd., Kita-ku, Tokyo, JP;

Inventor:

Takahiro Nagata, Tomioka, JP;

Assignee:

YOKOWO CO., LTD., Kita-ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 31/02 (2006.01); G01R 31/28 (2006.01); H01R 12/00 (2006.01); H01R 4/48 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06722 (2013.01); G01R 1/06772 (2013.01); G01R 1/07371 (2013.01);
Abstract

The inspection jig includes a rigid substrate, a flexible substrate connected to the rigid substrate, a contactor block for supporting a part of the flexible substrate in a state that the part of the flexible substrate is protruded with respect to the rigid substrate, a contactor provided on a protruding portion of the flexible substrate, and a spring probe supported by the contactor block, one end of which is in contact with a contact pad provided on a lower surface of the rigid substrate, and the other end of which protrudes from a protruding portion of the flexible substrate.


Find Patent Forward Citations

Nagata, Takahiro. (2020). Inspection jig (U.S. Patent No. 10598694). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10598694

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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