The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Jul. 25, 2017
Applicant:

Universite DE Bourgogne, Dijon, FR;

Inventors:

Eric Bourillot, Dijon, FR;

Eric Lesniewska, Dijon, FR;

Pauline Vitry, Moneteau, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/32 (2010.01); G01N 29/06 (2006.01); G01N 29/24 (2006.01); G01Q 60/36 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/32 (2013.01); G01N 29/0663 (2013.01); G01N 29/0681 (2013.01); G01N 29/2418 (2013.01); G01Q 60/363 (2013.01); G01N 2291/0427 (2013.01);
Abstract

An acoustic analysis device based on atomic force microscopy for the volume analysis of an organic or inorganic sample includes a support on which the sample is immobilized, and an atomic force microscopy lever having a free end provided with a part that interacts with an upper face of the sample and scans said upper face, one or at least two of the independent piezoelectric actuators supplying ultrasonic waves with interferential coupling, and acoustic measurement and analysis bodies associated with the atomic force microscopy lever. The support is a total reflection prism to which the piezoelectric actuators are applied, and the piezoelectric actuators are applied in determined positions on said prism in order to define determined angles of excitation of the ultrasonic waves.


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