The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2020
Filed:
Mar. 01, 2019
Shimadzu Corporation, Kyoto, JP;
Kazuma Watanabe, Kyoto, JP;
Keita Fujino, Kyoto, JP;
Eiji Iida, Kyoto, JP;
Masato Hirade, Kyoto, JP;
Kenji Yamasaki, Kyoto, JP;
Hideo Nakajima, Kyoto, JP;
Yuichiro Ikeda, Kyoto, JP;
Hiroshi Arai, Kyoto, JP;
Shimadzu Corporation, Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto-shi, Kyoto, JP;
Abstract
A scanning probe microscope includes a light source, a detector, a housing, an opening and closing door, an opening and closing sensor, a control unit, and the like. The opening and closing door is provided in the housing. The control unitalso functions as the light intensity change processing unit. In the scanning probe microscope, when the opening and closing sensor detects opening and closing of the opening and closing door, the light intensity change processing unit automatically changes the intensity of light irradiated from the light source based on a detection result of the opening and closing sensor. Therefore, it is possible to omit light intensity adjustment work performed manually by the user. As a result, the workability of the user when using the scanning probe microscopecan be improved.