The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Dec. 17, 2018
Applicant:

Thermo Finnigan Llc, San Jose, CA (US);

Inventors:

Edward B. McCauley, Cedar Park, TX (US);

Scott T. Quarmby, Round Rock, TX (US);

Assignee:

THERMO FINNIGAN LLC, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/86 (2006.01); H01J 49/00 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8679 (2013.01); G01N 30/7233 (2013.01); H01J 49/0009 (2013.01); G01N 30/7206 (2013.01);
Abstract

A method of assessing the linearity and dynamic range of a mass spectrometer is described comprising analyzing two or more test standards containing positional isomers, for example, using a series of N isomeric analytes with or without an internal standard where N is an integer from 2 to 6 inclusive. The concentrations of the N isomeric analytes may or may not be interleaved between two or more standards. The method allows for repeated instrument characterization without having many of the problems associated with using only a single standard such as octafluoronaphthalene (OFN), for example, persistence, and it may lessen sample carryover issues between adjacent samples. Methods are described using positional isomers of dibromodifluorobenzene in various configurations that show an improved means for qualitative and quantitative analysis of one or more analytes by GC-MS.


Find Patent Forward Citations

Loading…