The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2020
Filed:
Apr. 10, 2017
Applicant:
Battelle Memorial Institute, Richland, WA (US);
Inventors:
Xiao-Ying Yu, Richland, WA (US);
Libor Kovarik, West Richland, WA (US);
Bruce W. Arey, Kennewick, WA (US);
Assignee:
Battelle Memorial Institute, Richland, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/02 (2006.01); H01J 37/16 (2006.01); H01J 37/26 (2006.01); H01J 37/20 (2006.01); G01N 23/2204 (2018.01);
U.S. Cl.
CPC ...
G01N 23/02 (2013.01); G01N 23/2204 (2013.01); H01J 37/16 (2013.01); H01J 37/20 (2013.01); H01J 37/26 (2013.01); H01J 2237/2802 (2013.01);
Abstract
Liquid sample imaging devices and processes are disclosed for high resolution TEM imaging and multimodal analyses of liquid sample materials in situ under high vacuum that are compatible with standard type TEM chip membranes and TEM sample holders allowing TEM liquid sample imaging to be performed wherever a TEM instrument is accessible and at a substantially reduced cost compared to prior art systems and approaches.