The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2020
Filed:
Oct. 24, 2017
Tomra Sorting Gmbh, Mülheim-Kärlich, DE;
Geoffrey Harold Madderson, Johannesburg, ZA;
Markus Dehler, Wedel, DE;
TOMRA SORTING GMBH, Müllheim-Kärlich, DE;
Abstract
A method for identifying the presence of partly liberated diamonds in a material stream. The method can include illuminating a material with a multi-wavelength beam including at least one monochromatic SWIR laser beam, and at least one IR scatter-/anti-scatter laser beam, capturing a portion of the at least one monochromatic SWIR laser beam after the monochromatic SWIR laser beam has been reflected and/or scattered by the material, producing a SWIR signal based on the captured portion of the at least one monochromatic SWIR laser beam, and capturing a first portion of the at least one IR scatter-/anti-scatter laser beam after the at least one IR scatter-/anti-scatter laser beam has been scattered and optionally reflected by the material.