The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2020
Filed:
Oct. 06, 2016
Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;
Akira Koide, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In the related art, no consideration is given to a configuration of a deformation detecting device, an installation place or an installation method for the measurement target. Therefore, there is provided a deformation detecting device including a film-like elastic body which has a first surface to be adhered to a measurement target and a second surface opposite to the first surface, and in which the second surface has at least one set of a recess portion and a projection portion in a first direction in a state where the first surface is adhered to the measurement target before deformation; a first electrode formed in a region of the recess portion of the second surface; a second electrode formed in a region of the projection portion of the second surface; a film-like piezoelectric body which has a uniform thickness and has a third surface disposed along the second surface of the elastic body and a fourth surface opposite to the third surface, and of which a shear modulus of elasticity is higher than that of the elastic body; a third electrode formed in a region of the fourth surface opposite to the first electrode; and a fourth electrode formed in a region of the fourth surface opposite to the second electrode.