The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Jun. 28, 2016
Applicant:

Nikon Corporation, Tokyo, JP;

Inventor:

Yasujiro Kiyota, Tokyo, JP;

Assignee:

NIKON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 3/00 (2006.01); C12M 1/00 (2006.01); C12M 1/34 (2006.01); C12M 1/36 (2006.01);
U.S. Cl.
CPC ...
C12M 41/14 (2013.01); C12M 23/50 (2013.01); C12M 41/00 (2013.01); C12M 41/36 (2013.01); C12M 41/44 (2013.01); C12M 41/46 (2013.01); C12M 41/48 (2013.01);
Abstract

An incubation apparatus, including a temperature-controlled room adjusted to be a predetermined environment condition, and incubating a sample of an incubation container inside the temperature-controlled room, includes a carrying apparatus, an imaging section, and an image analyzing section. The carrying apparatus carries the incubation container in the temperature-controlled room. The imaging section photographs a whole of the incubation container inside the temperature-controlled room. The image analyzing section analyses an operation state of the incubation apparatus or an incubating environment state of the sample based on a total observing image of the incubation container photographed at the imaging section, and outputs an error signal notifying an abnormality of the operation state or the incubating environment state in accordance with the analysis result.


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