The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2020
Filed:
Feb. 25, 2016
Ultrasonic-wave probe, ultrasonic-wave diagnosis apparatus, and test method of ultrasonic-wave probe
Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;
Shinya Kajiyama, Tokyo, JP;
Yutaka Igarashi, Tokyo, JP;
Yusaku Katsube, Tokyo, JP;
Takuma Nishimoto, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A test for screening defects of a transmission/reception circuit in an IC is enabled at low cost, without withstand voltage violation, and without carrying out electrical contacts with many terminals connected to oscillators. In a transmission/reception separation switch circuit using transistors as switch elements, a potential of a gate is lowered in a test more than the potential in a case of reception to avoid gate-source withstand-voltage violation when a large-amplitude signal is input, and an internal-signal loopback test is carried out without destroying a reception circuit.