The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Jun. 26, 2015
Applicant:

Sunnybrook Research Institute, Toronto, Ontario, CA;

Inventors:

James Mainprize, Toronto, CA;

Olivier Alonzo-Proulx, Toronto, CA;

Martin Yaffe, Toronto, CA;

Gordon Mawdsley, Toronto, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/12 (2006.01); A61B 6/03 (2006.01); G06F 19/00 (2018.01);
U.S. Cl.
CPC ...
A61B 6/502 (2013.01); A61B 6/032 (2013.01); A61B 6/12 (2013.01); A61B 6/461 (2013.01); A61B 6/469 (2013.01); A61B 6/481 (2013.01); G06F 19/321 (2013.01);
Abstract

Systems and methods for generating imaging biomarkers that indicate detectability or conspicuity of lesions that may be present in mammographic images are provided. In general, a task-based measure of a signal-to-noise ratio ('SNR') measurement of a detection task is computed over a number of small regions-of-interest ('ROIs') in an image, and the computed parameter is used to predict what detection rates should be if a lesion was present in the image. As such, the computed parameter can be used to define an imaging biomarker that is a “masking measure” that indicates the degree of conspicuity of lesions that may be present in a given a mammographic image.


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