The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Nov. 02, 2011
Applicants:

Per Johan Mikael Johansson, Kungsangen, SE;

Yih-shen Chen, Hsinchu, TW;

Chia-chun Hsu, Taipei, TW;

Michael Roberts, Neuilly sur Seine, FR;

Inventors:

Per Johan Mikael Johansson, Kungsangen, SE;

Yih-Shen Chen, Hsinchu, TW;

Chia-Chun Hsu, Taipei, TW;

Michael Roberts, Neuilly sur Seine, FR;

Assignee:

HFI INNOVATION, INC., Zhubei, Hsinchu County, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04W 24/08 (2009.01); H04W 52/14 (2009.01); H04W 24/00 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04W 24/08 (2013.01); H04W 24/00 (2013.01); H04W 52/14 (2013.01);
Abstract

A method of MDT information logging and problem event reporting is provided. The method supports provisioning of reference events to enable correlation of system time and the problem occurrence. In one embodiment, a problem event report includes time information directly or indirectly related to a reference event. A method of handling battery condition is also provided. The method supports autonomously suspending or resuming OAM activities in MDT based on predefined battery condition. In one embodiment, a testable battery condition handling is designed for MDT logging.


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