The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Sep. 28, 2015
Applicant:

The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);

Inventors:

John S. Y. Ho, Stanford, CA (US);

Ada Shuk Yan Poon, Redwood City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/00 (2006.01); H02J 50/30 (2016.01); A61N 1/378 (2006.01); G02B 6/124 (2006.01); A61B 5/00 (2006.01); H02J 50/27 (2016.01); G02B 27/56 (2006.01); H01Q 1/24 (2006.01); H01Q 3/26 (2006.01); H01Q 21/22 (2006.01);
U.S. Cl.
CPC ...
H02J 50/30 (2016.02); A61B 5/0031 (2013.01); A61B 5/686 (2013.01); A61N 1/3787 (2013.01); G02B 1/002 (2013.01); G02B 6/1245 (2013.01); G02B 27/56 (2013.01); H01Q 1/248 (2013.01); H01Q 3/2676 (2013.01); H01Q 21/22 (2013.01); H02J 50/27 (2016.02); A61B 2560/0219 (2013.01);
Abstract

A planar immersion lens can include any number of features. A planar immersion lens can be configured to control a phase profile of an incident wave by modulating the incident wave with sub-wavelength structures of varying impedances. The planar immersion lens can also be directly excited, with electronics or other subwavelength sources coupled to the planar immersion lens, to generate a wave with the desired phase profile. The planar immersion lens can include a plurality of metallic elements and passive elements disposed over a substrate. The passive elements can be selected, based on both the intrinsic and mutual impedances of the elements, to shape the spatial phase profile of the incident wave within this phase range. The phase gradient can be introduced along the incident material/refractive material interface to focus the incident wave into the refractive material having wave components at or beyond the critical angle. Methods are also provided.


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