The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2020
Filed:
Nov. 16, 2016
Micromass Uk Limited, Wilmslow, GB;
Leco Corporation, St. Joseph, MI (US);
John Brian Hoyes, Stockport, GB;
Anatoly Verenchikov, Montenegro, RU;
Mikhail Yavor, St. Petersburg, RU;
Keith Richardson, New Mills-High Peak, GB;
Jason Wildgoose, Stockport, GB;
Micromass UK Limited, Wilmslow, GB;
LECO CORPORATION, St. Joseph, MI (US);
Abstract
A time-of-flight mass spectrometer is disclosed comprising: an ion deflector () configured to deflect ions to different positions in a first array of positions at different times; a position sensitive ion detector (); and ion optics () arranged and configured to guide ions from the first array of positions to the position sensitive detector () so as to map ions from the first array of positions to a second array of positions on the position sensitive detector (); wherein the ion optics includes at least one ion mirror for reflecting the ions.