The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2020
Filed:
Dec. 22, 2017
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Yujie Lu, Vernon Hills, IL (US);
Xiaohui Zhan, Vernon Hills, IL (US);
Zhou Yu, Wilmette, IL (US);
Richard Thompson, Hawthorn Woods, IL (US);
Canon Medical Systems Corporation, Otawara-shi, JP;
Abstract
A method and apparatus is provided to simulate and correct for scatter flux detected in a computed tomography (CT) scanner. The scatter flux from a bowtie filter and an anti-scatter grid are pre-calculated to generate respective scatter tables. Scatter from an imaged object is simulated for some views of a CT scan using a three-step radiative transfer equation (RTE) method. Using the simulated scatter flux from these views, an accelerated simulation method, such as a multiplicative method, an additive method, and a kernel-based method, can determine scatter flux for the remaining views. The spatial model for X-ray scatter from the object can be based on a reconstructed image of object, and can be segmented into organs and material components having different scatter cross-sections. A scatter model outside the imaging region can be extrapolated using low-dose scanning, a scout scan, and/or anatomical information.