The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Mar. 23, 2018
Applicant:

Capsovision, Inc., Saratoga, CA (US);

Inventors:

Kang-Huai Wang, Saratoga, CA (US);

Gordon C. Wilson, San Francisco, CA (US);

Mark A. Hadley, Los Altos, CA (US);

Assignee:

CAPSOVISION INC, Saratoga, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/586 (2017.01); G01B 11/25 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
G06T 7/586 (2017.01); G01B 11/2518 (2013.01); H04N 5/23229 (2013.01); G06T 2200/08 (2013.01);
Abstract

A method and apparatus of capturing non-structured light images and structured light images for deriving depth information are disclosed. According to the method, one or more non-SL (non-structured light) images without structured light and one or more initial SL (structured light) images formed on a common image plane are captured by projecting structured light patterns in a visible spectrum with the structured light source adjusted to generate initial structured light at an initial intensity level. The signal quality of structured light patterns reflected from one or more objects is evaluated based on the non-SL images and the initial SL images. If the signal quality of structured light patterns is below a threshold, a next set of SL images are captured by increasing the structured light level from a previous level until the signal of the structured light patterns is satisfactory.


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