The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2020
Filed:
Oct. 03, 2017
International Business Machines Corporation, Armonk, NY (US);
Kristofer A. Duer, Manchester, NH (US);
John T. Peyton, Arlington, MA (US);
Stephen D. Teilhet, Milford, NH (US);
Lin Tan, Waterloo, CA;
Jinqiu Yang, Waterloo, CA;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Vulnerability testing of applications may include one or more of identifying a number of paths from a software application being tested, identifying a number of nodes associated with the paths, determining one or more of the paths which share one or more of the nodes, designating the paths which share the nodes as overlapping paths, and displaying the overlapping paths and the shared nodes as an interactive visualization to identify to identify optimal locations to fix one or more vulnerability findings.