The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Sep. 27, 2018
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Anurag Dwarakanath, Bangalore, IN;

Neville Dubash, Mumbai, IN;

Sanjay Podder, Thane, IN;

Kishore P Durg, Bangalore, IN;

Shrikanth N C, Bangalore, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01); G06F 11/00 (2006.01); G06F 9/50 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3672 (2013.01); G06F 9/5038 (2013.01); G06F 11/008 (2013.01); G06F 11/36 (2013.01); G06F 11/3608 (2013.01); G06F 11/3684 (2013.01); G06F 11/3688 (2013.01); G06F 2201/81 (2013.01);
Abstract

A device may determine probabilities for test scripts associated with a test to be executed on a software element, where a respective probability is associated with a respective test script, indicates a likelihood that the respective test script will be unsuccessful in a test cycle, and is determined based on historical test results, associated with the software element, for the respective test script. The device may generate, based on the probabilities, a test script execution order, of the test scripts, for the test cycle, and may execute, based on the test script execution order, the test on the software element in the test cycle. The device may dynamically generate, based on results for the test in the test cycle, an updated test script execution order, and may execute, based on the updated test script execution order, the test on the software element in the test cycle.


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