The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Oct. 16, 2017
Applicant:

Omron Corporation, Kyoto-shi, Kyoto, JP;

Inventor:

Shinsuke Kawanoue, Kyoto, JP;

Assignee:

OMRON Corporation, Kyoto-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G05B 19/05 (2006.01); G05B 13/02 (2006.01); G05B 23/02 (2006.01); G05B 19/042 (2006.01);
U.S. Cl.
CPC ...
G05B 19/054 (2013.01); G05B 13/0265 (2013.01); G05B 19/058 (2013.01); G05B 23/0289 (2013.01); G05B 23/0294 (2013.01); G05B 19/0428 (2013.01); G05B 23/0237 (2013.01); G05B 2219/14014 (2013.01); G05B 2219/14037 (2013.01);
Abstract

A control system includes a controller for controlling a control target and redundant devices accessible from the controller. The control system includes a feature quantity generation unit that generates a feature quantity from data associated with the redundant devices, an abnormality detection unit that determines whether an abnormality has occurred in one of the redundant devices based on the feature quantity generated by the feature quantity generation unit and a predetermined abnormality detection parameter, a switch unit that switches the redundant devices between a working mode and a standby mode when the abnormality detection unit determines that an abnormality has occurred, and a learning unit that performs machine learning using the data associated with the redundant devices to determine the abnormality detection parameter.


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