The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2020
Filed:
Nov. 14, 2018
Boe Technology Group Co., Ltd., Beijing, CN;
Fuzhou Boe Optoelectronics Technology Co., Ltd., Fujian, CN;
Yunjin Chen, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
FUZHOU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Fuzhou, Fujian, CN;
Abstract
An alignment detection method includes: establishing a coordinate system; providing at least one group of a first and second mark regions arranged on a first and second substrates respectively, the first and second mark regions being arranged opposite to each other so as to form at least two groups of first and second alignment marks; detecting an overlap level between an orthogonal projection of each of the first alignment marks onto the first substrate and that of the second alignment marks onto the second substrate, selecting a group of the first and second alignment marks having the highest overlap level, and acquiring, in the coordinate system, coordinate values of the first and second alignment marks in the group having the highest overlap level; and comparing the coordinate values with a threshold, so as to determine alignment accuracy between the first and second substrates.