The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2020
Filed:
Jun. 25, 2019
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Qingsong Zou, Singapore, SG;
Anthony Lim, Singapore, SG;
Apria Laksono, Singapore, SG;
Michelle Li, Singapore, SG;
Andreas Klopfer, Doren, AT;
Vincent Vaccarelli, Getzville, NY (US);
LEICA INSTRUMENTS (SINGAPORE) PTE. LTD., Singapore, SG;
Abstract
A microscope arrangement includes a plurality of microscopes, and a control device having a display screen and a data link. The display screen is configured to show microscopy data of the microscopes via the data link using display symbols, each display symbol representing microscopy data received by the control device from a different one of the microscopes. In at least one operational state of the control device, the display symbols are moveable on the display screen to correspond to an arrangement of the microscopes.