The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Jan. 12, 2018
Applicant:

Flir Systems Trading Belgium Bvba, Meer, BE;

Inventor:

Jeremy Huddleston, Oviedo, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 13/14 (2006.01); G02B 13/00 (2006.01); G02B 7/04 (2006.01); H04N 5/33 (2006.01);
U.S. Cl.
CPC ...
G02B 13/008 (2013.01); G02B 7/04 (2013.01); G02B 13/003 (2013.01); G02B 13/14 (2013.01); H04N 5/33 (2013.01);
Abstract

An imaging lens for use with an operational waveband over any subset of 7.5-13.5 μm may include a first optical element of a first high-index material and a second optical element of a second high-index material. At least two surfaces of the first and second optical elements may be optically powered surfaces. A largest clear aperture of all optically powered surfaces may not exceed a diameter of an image circle of the imaging lens corresponding to a field of view of 55 degrees or greater by more than 30%. The first and second high-index materials may have a refractive index greater than 2.2 in the operational waveband, an absorption per mm of less than 75% in the operational waveband, and an absorption per mm of greater than 75% in a visible waveband of 400-650 nm.


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