The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2020
Filed:
Oct. 29, 2012
Torsten Matthias, Wendelsheim, DE;
Hans-peter Schimon, Heiningen, DE;
Jens Blecken, Fuerfeld, DE;
Markus Wulf, Alzey, DE;
Matthias Wende, Mommenheim, DE;
Torsten Matthias, Wendelsheim, DE;
Hans-Peter Schimon, Heiningen, DE;
Jens Blecken, Fuerfeld, DE;
Markus Wulf, Alzey, DE;
Matthias Wende, Mommenheim, DE;
Other;
Abstract
The invention relates to an automated method for the optical analysis of structures, in particular for the analysis and determination of biological cellular structures, and to an apparatus for this purpose, wherein an electro-optical unit generates an electronic image of two- and three-dimensional structures present in the sample, a storage medium stores the image, a computer-controlled displacement device establishes an optimized image sharpness of the image by changing the distance between sample and the optical unit, wherein the displacement device is controlled by contrast analysis and color value detection, and a computer unit compares the images generated by the electro-optical unit of two- and/or three-dimensional structures with the known structures stored in a database, and the structures registered by the optical unit are assigned by means of an algorithm to characteristic grids, structures or patterns.