The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Apr. 29, 2014
Applicant:

Arkray, Inc., Kyoto, JP;

Inventors:

Kazuo Fukuda, Kyoto, JP;

Hirokazu Matsuda, Kyoto, JP;

Akiko Okami, Kyoto, JP;

Assignee:

ARKRAY, Inc., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/49 (2006.01); G01N 27/327 (2006.01);
U.S. Cl.
CPC ...
G01N 33/49 (2013.01); G01N 27/3273 (2013.01); G01N 27/3274 (2013.01);
Abstract

Provided are a measuring apparatus and method for obtaining a measurement value from a response to a signal applied to a sample, wherein the measuring apparatus includes a first measuring unit that measures a first electric response to a first signal that is input to a first pair of electrodes that can come into contact with a sample, a second measuring unit that measures a second electric response to a second signal that is input to a second pair of electrodes that can come into contact with the sample, the second signal changing its value from a first level to a second level and thereafter maintaining the second level for a certain period of time, as a peak value of a response signal with respect to the change in the second signal, and a control unit that corrects a value indicating the amount of a measuring target component of the sample, the value being obtained from the first electric response, based on the peak value of the response signal.


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