The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2020
Filed:
Jan. 16, 2018
Honda Motor Co., Ltd., Minato-ku, Tokyo, JP;
Kenji Sato, Wako, JP;
Kazuhito Nakao, Wako, JP;
HONDA MOTOR CO., LTD., Tokyo, JP;
Abstract
An X-ray diffraction measurement method includes an arranging step of arranging a shielding plate and a two-dimensional detector on an outgoing optical axis, and a calculating step of calculating a diffraction profile indicating an X-ray intensity with respect to a diffraction angle of the object to be measured, on the basis of a two-dimensional X-ray image detected by the two-dimensional detector. In the arranging step, the shielding plate is arranged in a manner so that the slit is inclined at least in a direction about the outgoing optical axis with respect to an orthogonal direction which is orthogonal to both the incident optical axis and the outgoing optical axis.