The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2020
Filed:
Apr. 30, 2019
Spirit Aerosystems, Inc., Wichita, KS (US);
Mark Davis Haynes, Andover, KS (US);
Glen Paul Cork, Wichita, KS (US);
Spirit AeroSystems, Inc., Wichita, KS (US);
Abstract
An in-line laser profilometry inspection system broadly comprises a first laser, a first sensor, a second laser, a second sensor, a camera, a calibration standard, and an interface. The lasers transmit first and second light signals to a stringer charge or other part. The sensors detect the light signals reflecting off first and second edge walls of the part. The camera obtains a top-down image of the part. The calibration standard provides structure for calibrating the inspection system via the lasers and sensors. The interface allows a user to oversee part inspection. Data generated from the reflected light signals corresponding to a part profile may be analyzed based on at least first and second derivatives of the part profile such that the part is inspected during a cutting procedure.