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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10591347 B1

PDFFull Text
Date of Patent:
Mar. 17, 2020

Filed:

Jun. 02, 2016

Method for measuring basis weight, method for manufacturing laminated film, and device for measuring basis weight

Applicant:

Sumitomo Chemical Company, Limited, Tokyo, JP;

Inventors:

Takayuki Yamano, Niihama, JP;

Takahiro Okugawa, Niihama, JP;

Assignee:

SUMITOMO CHEMICAL COMPANY, LIMITED, Tokyo, JP;

Attorney:

Panitch Schwarze Belisario & Nadel LLP

Primary Examiner:

Austin Murata

Int. Cl.
CPC ...
G01G 9/00 (2006.01); G01B 11/06 (2006.01); G01G 17/04 (2006.01); C23C 26/00 (2006.01); G01G 7/02 (2006.01); G01N 21/25 (2006.01); G06F 17/11 (2006.01);
U.S. Cl.
CPC ...
G01G 9/005 (2013.01); C23C 26/00 (2013.01); G01B 11/06 (2013.01); G01G 7/02 (2013.01); G01G 17/04 (2013.01); G01N 21/251 (2013.01); G06F 17/11 (2013.01);
Abstract

To measure the mass per unit area of an applied layer in a layered film while preventing a measurement error from being caused by thickness unevenness, a per-unit-area-mass measuring device () includes a light projector () configured to project light having a center wavelength of 405 nm, a light projector () configured to project light having a center wavelength of 850 nm, light receivers () configured to receive light having been transmitted through a separator (), and a control section () configured to calculate the mass per unit area of a heat-resistant layer () on the basis of the respective transmitted-light intensities of the light having a center wavelength of 405 nm and the light having a center wavelength of 850 nm.

Find Patent Forward Citations

Yamano, Takayuki. (2020). Method for measuring basis weight, method for manufacturing laminated film, and device for measuring basis weight (U.S. Patent No. 10591347). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10591347

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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