The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2020
Filed:
Jun. 09, 2017
Topcon Corporation, Tokyo, JP;
Nobuyuki Nishita, Tokyo, JP;
Kenichiro Yoshino, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
Provided is a survey system capable of acquiring point group data of a three-dimensional object desired to be measured without complicated setting. A survey system includes a surveying instrument including a tracking section that tracks a target by emitting tracking light and receiving the tracking light reflected on the target, and a scanner that rotates horizontally and integrally with the surveying instrument and performs scanning around a single axis in a vertical direction, and the scanner and the tracking section are offset in the horizontal direction. Therefore, a scanning line (SL) does not match the target, and is always controlled around the target.