The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2020
Filed:
Aug. 11, 2018
Siemens Healthcare Gmbh, Erlangen, DE;
Oliver Hornung, Dormitz, DE;
Markus Kowarschik, Nürnberg, DE;
Siemens Healthcare GmbH, Erlangen, DE;
Abstract
A method for acquiring an image data record with an x-ray imaging system with a recording system that may be rotated around an examination object is provided. The recording system is embodied for an endless rotation. The method includes providing a calibration data record that has measurement data from a plurality of rotations of the recording system in endless rotation. At least one selectable acquisition parameter is received from the group consisting of: period of acquisition; number of projection images to be acquired; angular region of the acquisition to be recorded; and angular increment between every two sequential projection images. An acquisition protocol with the selected acquisition parameter(s) is determined from the provided calibration data record. The determined acquisition protocol is loaded, and an image data record is recorded using the determined acquisition protocol.