The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Oct. 05, 2015
Applicant:

Ibex Innovations Ltd., Sedgefield, Durham, GB;

Inventors:

Paul Scott, Sedgefield, GB;

Gary Gibson, Sedgefield, GB;

Neil Loxley, Sedgefield, GB;

Assignee:

IBEX Innovations Ltd., Sedgefield Durham, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01T 1/29 (2006.01); G06F 19/00 (2018.01); G06T 5/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 6/5282 (2013.01); A61B 6/4291 (2013.01); G01T 1/2985 (2013.01); G06F 19/321 (2013.01); G06T 5/002 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20182 (2013.01);
Abstract

An x-ray apparatus comprises an x-ray source and an x-ray detector and there between a member that is configured to perturb x-ray photons incident thereon. The apparatus further comprises a first database of values representative of material type and material thicknesses, a second database of scatter radiation values indicative of material type and/or material thicknesses, a processor configured to perform an algorithm which compares the output signal of the x-ray detector with values in the first database and to output a most likely material and/or thickness from the first database; selects from the second database the scatter radiation associated with the material type and/or material thickness; and removes the scatter radiation from an output signal of the x-ray detector.


Find Patent Forward Citations

Scott, Paul. (2020). Scatter in x-ray apparatus and methods of their use (U.S. Patent No. 10588592). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10588592

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…