The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2020
Filed:
Sep. 01, 2015
Sap Portals Israel Ltd, Ra'anana, IL;
Gary Machol, Kfar Saba, IL;
Asaf Bruner, Ra'anana, IL;
Roy Fishman, Kfar Yona, IL;
Sarah Lavie, Tel Mond, IL;
Tahel Milstein, Petah Tikvah, IL;
Dany Shapiro, Adumin, IL;
SAP Portals Israel Ltd., Ra'anana, IL;
Abstract
The present disclosure involves systems, software, and computer implemented methods for correlating critical events to identified log data. An example event log analyzer can identify a set of log messages. One or more occurrences of a first critical event and a time of each of the occurrences are identified. One or more candidate subsets of log messages are identified. Each log message in each candidate subset is associated with a timestamp that is within a predefined time window prior to the time of an occurrence of the first critical event. A candidate subset of log messages is selected as a correlator of the first critical event. A rule is defined using the selected candidate subset of log messages. The rule defines a second critical event that correlates to the first critical event. The rule is associated with one or more actions to perform when the second critical event occurs.