The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10587487 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 10, 2020

Filed:

Sep. 23, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Ryan A. Garrett, Toronto, CA;

Robert J. McKeown, Newburyport, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); H04L 12/26 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 43/067 (2013.01); H04L 41/142 (2013.01);
Abstract

A computer program product for selecting time-series data is provided. The computer program product includes a computer readable storage medium having program instructions embodied therewith. The program instructions are readable and executable by a processing circuit to cause the processing circuit to assemble, by the processing circuit, a set of analytic assessment tools for time-series data, engage, by the processing circuit, the analytic assessment tools to measure characteristics-of-importance in a relevant analytic domain for sets of the time-series data, generate, by the processing circuit, as a measurement result, a score for each set of the time-series data based on the associated characteristics-of-importance and rank, by the processing circuit, the sets of the time-series data in accordance with the score for each set of the time-series data for subsequent time-series data selection.


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Garrett, Ryan. (2020). Selecting time-series data for information technology (it) operations analytics anomaly detection (U.S. Patent No. 10587487). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10587487

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