The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2020

Filed:

Jan. 19, 2018
Applicant:

Sandisk Technologies Llc, Plano, TX (US);

Inventors:

Tianyu Tang, Milpitas, CA (US);

Venkatesh Ramachandra, San Jose, CA (US);

Srinivas Rajendra, Milpitas, CA (US);

Assignee:

SANDISK TECHNOLOGIES LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 3/017 (2006.01); H03K 17/687 (2006.01); H03M 1/66 (2006.01);
U.S. Cl.
CPC ...
H03K 3/017 (2013.01); H03K 17/687 (2013.01); H03K 17/6871 (2013.01); H03M 1/66 (2013.01);
Abstract

A correction system is configured to correct for duty cycle distortion and/or cross-point distortion in a pair of sample signals. A slope adjustment circuit is configured to generate a plurality of pairs of intermediate signals according to a plurality of drive strengths. A measurement circuit is configured to measure for duty cycle distortion and/or cross-point distortion, and the slope adjustment circuit is configured to set the plurality of drive strengths based on the measurement. The setting of the drive strengths may reduce certain rising and falling slopes of certain transitions of the plurality of intermediate signals, which in turn may reduce duty cycle distortion and/or cross-point distortion in the sample signals.


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