The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2020

Filed:

Nov. 30, 2017
Applicant:

Nuctech Company Limited, Beijing, CN;

Inventors:

Ziran Zhao, Beijing, CN;

Jianping Gu, Beijing, CN;

Qian Yi, Beijing, CN;

Bicheng Liu, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/73 (2017.01); G06T 5/20 (2006.01); G06T 5/50 (2006.01); G06T 5/00 (2006.01); G01V 5/00 (2006.01); G01N 23/04 (2018.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G01V 5/0016 (2013.01); G06T 5/002 (2013.01); G06T 5/20 (2013.01); G06T 5/50 (2013.01); G06T 7/0004 (2013.01); G06T 7/74 (2017.01); G01N 23/04 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30112 (2013.01);
Abstract

The present disclosure discloses an inspection device and a method for inspecting a container. Transmission scanning is performed on the inspected container using a scanning device including a sparse area array detector to obtain scan data. Digital focusing is performed at a specific depth position in a depth direction. Defocused pixel values are filtered out to obtain a slice image at the specific depth position. It is judged whether dangerous articles or suspicious articles are included in the slice image.


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