The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2020
Filed:
May. 16, 2016
Adobe Inc., San Jose, CA (US);
Mohammad Ghavamzadeh, San Jose, CA (US);
Alan John Malek, Los Gatos, CA (US);
Yinlam Chow, San Mateo, CA (US);
Sumeet Katariya, Madison, WI (US);
Adobe Inc., San Jose, CA (US);
Abstract
Embodiments of the present invention are directed at providing a sequential multiple hypothesis testing system. In one embodiment, feedback is collected for hypothesis tests of a multiple hypothesis tests. Based on the collected feedback, a sequential p-value is calculated for each of the hypothesis tests utilizing a sequential statistic procedure that is designed to compare an alternative case with a base case for a respective hypothesis test. A sequential rejection procedure can then be applied to determine whether any of the hypothesis tests have concluded based on the respective p-value. A result of the determination can then be output to apprise a user of a state of the multiple hypothesis test. This process can then be repeated until a maximum sample size is reached, termination criterion is met, or all tests are concluded. Other embodiments may be described and/or claimed.