The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2020

Filed:

Feb. 17, 2016
Applicant:

Linkedin Corporation, Mountain View, CA (US);

Inventors:

David J. Stein, Mountain View, CA (US);

Xu Miao, Sunnyvale, CA (US);

Lance M. Wall, San Francisco, CA (US);

Joel D. Young, Milpitas, CA (US);

Eric Huang, San Francisco, CA (US);

Songxiang Gu, Sunnyvale, CA (US);

Da Teng, Sunnyvale, CA (US);

Chang-Ming Tsai, Fremont, CA (US);

Sumit Rangwala, Fremont, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01);
Abstract

The disclosed embodiments provide a system for processing data. During operation, the system obtains a hierarchical representation containing a set of namespaces of a set of features shared by a set of statistical models. Next, the system uses the hierarchical representation to obtain, from one or more execution environments, a subset of the features for use in calculating the derived feature. The system then applies a formula from the hierarchical representation to the subset of the features to produce the derived feature. Finally, the system provides the derived feature for use by one or more of the statistical models.


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