The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2020

Filed:

Oct. 24, 2018
Applicant:

Aible Inc., San Francisco, CA (US);

Inventors:

Arijit Sengupta, San Francisco, CA (US);

Jonathan Wray, San Francisco, CA (US);

Grigory Nudelman, San Francisco, CA (US);

Daniel Kane, San Francisco, CA (US);

Geoffrey Grant, San Francisco, CA (US);

Assignee:

AIble Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 7/00 (2006.01); G06N 3/08 (2006.01); G06T 11/20 (2006.01); G06F 16/90 (2019.01); G06F 11/34 (2006.01); G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06F 11/3447 (2013.01); G06F 16/9024 (2019.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01); G06T 11/206 (2013.01);
Abstract

A method includes receiving data characterizing a target accuracy and a performance metric of a model; rendering, within a graphical user interface display space, a plot including a first axis and a second axis, the first axis including a characterization of false positive and the second axis including a characterization of false negative; and rendering, within the graphical user interface display space and within the plot, a graphical object at a location characterizing the performance metric and a visualization indicative of the target accuracy. Related apparatus, systems, techniques and articles are also described.


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