The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2020
Filed:
Feb. 19, 2015
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Kyota Higa, Tokyo, JP;
Ruihan Bao, Tokyo, JP;
Takami Sato, Tokyo, JP;
Ryota Mase, Tokyo, JP;
Kota Iwamoto, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06F 16/583 (2019.01); G06Q 30/06 (2012.01); G06Q 10/08 (2012.01);
U.S. Cl.
CPC ...
G06K 9/00577 (2013.01); G06F 16/5838 (2019.01); G06K 9/00201 (2013.01); G06Q 10/087 (2013.01); G06Q 30/06 (2013.01); G06K 2209/17 (2013.01);
Abstract
Disclosed is a display condition analysis device which is capable of analyzing the display conditions of products. This display condition analysis device is provided with: a product recognition means for recognizing, from a display image taken of products on display, the products in the display image; and a display condition analysis means for analyzing, on the basis of the positions of the recognized products, the display conditions of the products on display.